✦ LIBER ✦
Observation of Slow Oxide Traps at MOSFETs Having Metal/High-k Gate Dielectric Stack in Accumulation Mode
✍ Scribed by Heung-Jae Cho; Younghwan Son; Byoungchan Oh; Sanghoon Lee; Jong-Ho Lee; Byung-Gook Park; Hyungcheol Shin
- Book ID
- 114620113
- Publisher
- IEEE
- Year
- 2010
- Tongue
- English
- Weight
- 753 KB
- Volume
- 57
- Category
- Article
- ISSN
- 0018-9383
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