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Application of DLTS and Laplace-DLTS to defect characterization in high-resistivity semiconductors

✍ Scribed by L.F. Makarenko; J.H. Evans-Freeman

Book ID: 103885380
Publisher: Elsevier Science
Year: 2007
Tongue: English
Weight: 158 KB
Volume: 401-402
Category: Article
ISSN: 0921-4526
DOI: 10.1016/j.physb.2007.09.047

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