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High resolution Laplace DLTS studies of defects in ion-implanted silicon

โœ Scribed by J.H Evans-Freeman; N Abdelgader; P.Y.Y Kan; A.R Peaker

Book ID
114165156
Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
99 KB
Volume
186
Category
Article
ISSN
0168-583X

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