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Analysis of Threshold Voltage Variability Due to Random Dopant Fluctuations in Junctionless FETs

✍ Scribed by Gnudi, A.; Reggiani, S.; Gnani, E.; Baccarani, G.


Book ID
119799703
Publisher
IEEE
Year
2012
Tongue
English
Weight
323 KB
Volume
33
Category
Article
ISSN
0741-3106

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