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Modeling and Analysis of Transistor Mismatch Due to Variability in Short-Channel Effect Induced by Random Dopant Fluctuation

โœ Scribed by Butt, N. Z.; Johnson, J. B.


Book ID
119799747
Publisher
IEEE
Year
2012
Tongue
English
Weight
342 KB
Volume
33
Category
Article
ISSN
0741-3106

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