Modeling and Analysis of Transistor Mismatch Due to Variability in Short-Channel Effect Induced by Random Dopant Fluctuation

✍ Scribed by Butt, N. Z.; Johnson, J. B.

• Book ID: 119799747
• Publisher: IEEE
• Year: 2012
• Tongue: English
• Weight: 342 KB
• Volume: 33
• Category: Article
• ISSN: 0741-3106
• DOI: 10.1109/led.2012.2199075