✦ LIBER ✦
Probability distribution functions of threshold voltage fluctuations due to random impurities in deca–nano MOSFETs
✍ Scribed by Shuichi Toriyama; Nobuyuki Sano
- Publisher
- Elsevier Science
- Year
- 2003
- Tongue
- English
- Weight
- 168 KB
- Volume
- 19
- Category
- Article
- ISSN
- 1386-9477
No coin nor oath required. For personal study only.