✦ LIBER ✦
Polysilicon gate enhancement of the random dopant induced threshold voltage fluctuations in sub-100 nm MOSFETs with ultrathin gate oxide
✍ Scribed by Asenov, A.; Saini, S.
- Book ID
- 114538094
- Publisher
- IEEE
- Year
- 2000
- Tongue
- English
- Weight
- 249 KB
- Volume
- 47
- Category
- Article
- ISSN
- 0018-9383
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