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Statistical Variability in Fully Depleted SOI MOSFETs Due to Random Dopant Fluctuations in the Source and Drain Extensions

โœ Scribed by Markov, S.; Binjie Cheng; Asenov, A.


Book ID
114572624
Publisher
IEEE
Year
2012
Tongue
English
Weight
403 KB
Volume
33
Category
Article
ISSN
0741-3106

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