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Estimation of delay variations due to random-dopant fluctuations in nanoscale CMOS circuits

โœ Scribed by Mahmoodi, H.; Mukhopadhyay, S.; Roy, K.


Book ID
117884158
Publisher
IEEE
Year
2005
Tongue
English
Weight
541 KB
Volume
40
Category
Article
ISSN
0018-9200

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