Experimental study of threshold voltage fluctuation due to statistical variation of channel dopant number in MOSFET's

✍ Scribed by Mizuno, T.; Okumtura, J.; Toriumi, A.

• Book ID: 114535937
• Publisher: IEEE
• Year: 1994
• Tongue: English
• Weight: 601 KB
• Volume: 41
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.333844