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AlGaN/GaN High Electron Mobility Transistor degradation under on- and off-state stress

✍ Scribed by E.A. Douglas; C.Y. Chang; D.J. Cheney; B.P. Gila; C.F. Lo; Liu Lu; R. Holzworth; P. Whiting; K. Jones; G.D. Via; Jinhyung Kim; Soohwan Jang; Fan Ren; S.J. Pearton

Book ID: 108210917
Publisher: Elsevier Science
Year: 2011
Tongue: English
Weight: 890 KB
Volume: 51
Category: Article
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2010.09.024

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