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A Simple Current Collapse Measurement Technique for GaN High-Electron Mobility Transistors

✍ Scribed by Joh, J.; del Alamo, J.A.; Jimenez, J.

Book ID: 111942700
Publisher: IEEE
Year: 2008
Tongue: English
Weight: 329 KB
Volume: 29
Category: Article
ISSN: 0741-3106
DOI: 10.1109/led.2008.2000919

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