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A Program for Device Model Parameter Extraction from Gate Capacitance and Current of Ultrathin and High- Gate Stacks

โœ Scribed by Fei Li; Register, L.F.; Hasan, M.M.; Banerjee, S.K.


Book ID
114618393
Publisher
IEEE
Year
2006
Tongue
English
Weight
647 KB
Volume
53
Category
Article
ISSN
0018-9383

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