Comparison of Modeling Approaches for the Capacitance–Voltage and Current–Voltage Characteristics of Advanced Gate Stacks

✍ Scribed by Palestri, P.; Barin, N.; Brunel, D.; Busseret, C.; Campera, A.; Childs, P. A.; Driussi, F.; Fiegna, C.; Fiori, G.; Gusmeroli, R.; Iannaccone, G.; Karner, M.; Kosina, H.; Lacaita, A. L.; Langer, E.; Majkusiak, B.; Compagnoni, C. M.; Poncet, A.; Sangiorgi, E.; Selmi, L.; Spinelli, A. S.; Walczak, J.

• Book ID: 114618555
• Publisher: IEEE
• Year: 2007
• Tongue: English
• Weight: 274 KB
• Volume: 54
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2006.887226