Radiation effects on the current–voltage and capacitance–voltage characteristics of advanced p–n junction diodes surrounded by shallow trench isolation

✍ Scribed by A. Poyai; E. Simoen; C. Claeys; K. Hayama; K. Kobayashi; H. Ohyama

• Book ID: 114165195
• Publisher: Elsevier Science
• Year: 2002
• Tongue: English
• Weight: 167 KB
• Volume: 186
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/s0168-583x(01)00910-7