Modeling of Tunnelling Currents in Hf-Based Gate Stacks as a Function of Temperature and Extraction of Material Parameters

✍ Scribed by Campera, A.; Iannaccone, G.; Crupi, F.

• Book ID: 114618548
• Publisher: IEEE
• Year: 2007
• Tongue: English
• Weight: 314 KB
• Volume: 54
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2006.887202