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A critical analysis of investigation of deep levels in high-resistivity CdS single crystals by photoelectric transient spectroscopy

✍ Scribed by A. P. Odrinskii

Book ID: 110138078
Publisher: Springer
Year: 2004
Tongue: English
Weight: 77 KB
Volume: 38
Category: Article
ISSN: 1063-7826
DOI: 10.1134/1.1682331

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