✦ LIBER ✦

$1/f$ Noise in Drain and Gate Current of MOSFETs With High-$k$ Gate Stacks

✍ Scribed by P. Magnone; F. Crupi; G. Giusi; C. Pace; E. Simoen; C. Claeys; L. Pantisano; D. Maji; V. Rao; P. Srinivasan

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Impact of high-k gate stack material wit

✍ P. Srinivasan; E. Simoen; L. Pantisano; C. Claeys; D. Misra 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 295 KB

Enhanced degradation of n-MOSFETs with h

✍ Dongwoo Kim; Seonhaeng Lee; Cheolgyu Kim; Chiho Lee; Jeongsoo Park; Bongkoo Kang 📂 Article 📅 2012 🏛 Elsevier Science 🌐 English ⚖ 212 KB

Investigation of Random Telegraph Noise

✍ Ju-Wan Lee; Byoung Hun Lee; Hyungcheol Shin; Jong-Ho Lee 📂 Article 📅 2010 🏛 IEEE 🌐 English ⚖ 763 KB

Interfacial layer quality effects on low

✍ P. Srinivasan; F. Crupi; E. Simoen; P. Magnone; C. Pace; D. Misra; C. Claeys 📂 Article 📅 2007 🏛 Elsevier Science 🌐 English ⚖ 221 KB

Model of random telegraph noise in gate-

✍ Lee, Ju-Wan; Lee, Jong-Ho 📂 Article 📅 2012 🏛 American Institute of Physics 🌐 English ⚖ 946 KB

Two-Dimensional Tunneling Effects on the

✍ Luisier, M.; Schenk, A. 📂 Article 📅 2008 🏛 IEEE 🌐 English ⚖ 697 KB