Two-Dimensional Tunneling Effects on the Leakage Current of MOSFETs With Single Dielectric and High- Gate Stacks

✍ Scribed by Luisier, M.; Schenk, A.

• Book ID: 114619419
• Publisher: IEEE
• Year: 2008
• Tongue: English
• Weight: 697 KB
• Volume: 55
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2008.922493