Two-dimensional modelling and characterization of gate-to-drain overlap contribution on the leakage current of a MOSFET, used as a GCD

✍ Scribed by E. Ciantar; S. Burgniard; R. Jérisian; J. Oualid

• Book ID: 112184878
• Publisher: John Wiley and Sons
• Year: 1993
• Tongue: English
• Weight: 437 KB
• Volume: 9
• Category: Article
• ISSN: 0748-8017
• DOI: 10.1002/qre.4680090417