✦ LIBER ✦
A two-dimensional numerical simulation of pulsed drain current transients in weak inversion and application to interface trap characterization on small geometry MOSFETs with ultrathin oxides
✍ Scribed by Ahmed, K.; Wortman, J.J.; Hauser, J.R.
- Book ID
- 114538337
- Publisher
- IEEE
- Year
- 2000
- Tongue
- English
- Weight
- 76 KB
- Volume
- 47
- Category
- Article
- ISSN
- 0018-9383
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