Interfacial layer quality effects on low-frequency noise (1/f) in p-MOSFETs with advanced gate stacks

✍ Scribed by P. Srinivasan; F. Crupi; E. Simoen; P. Magnone; C. Pace; D. Misra; C. Claeys

• Book ID: 108210682
• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 221 KB
• Volume: 47
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/j.microrel.2007.01.012