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X-Ray Topographic Investigation of Dendritic Silicon Crystals

✍ Scribed by Dr. M. Ya. Dashevsky; V. A. Isaakjan; M. A. Khatsernov

Publisher
John Wiley and Sons
Year
1972
Tongue
English
Weight
379 KB
Volume
7
Category
Article
ISSN
0232-1300

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✦ Synopsis

and Alloys

X-Ray Topographic Investigation of Dendritic Silicon Crystals

Using Lang and double-crystal X-ray topographic methods the dislocation structure of dendritic silicon crystals have becn investigated. I t is shown that t,he surface layers of these crystals have a more perfect structure than their bulk volume. The t w i n lamella is a dislocation-frec formation and there are dislocation-frec zones -1,5 mm in width in the volume of crystals.

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