and Alloys ## X-Ray Topographic Investigation of Dendritic Silicon Crystals Using Lang and double-crystal X-ray topographic methods the dislocation structure of dendritic silicon crystals have becn investigated. I t is shown that t,he surface layers of these crystals have a more perfect structure
β¦ LIBER β¦
X-ray double crystal topographic measurements of distorted crystals
β Scribed by Dr. E. M. Trukhanov; Dr. I. S. Vassilev; P. A. Botev; Dr. N. V. Lyakh; Dr. Yu. G. Sidorov; Prof. Dr. S. I. Stenin
- Publisher
- John Wiley and Sons
- Year
- 1989
- Tongue
- English
- Weight
- 499 KB
- Volume
- 24
- Category
- Article
- ISSN
- 0232-1300
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
X-Ray Topographic Investigation of Dendr
β
Dr. M. Ya. Dashevsky; V. A. Isaakjan; M. A. Khatsernov
π
Article
π
1972
π
John Wiley and Sons
π
English
β 379 KB
π 1 views
X-ray double crystal measurements of lat
β
P. Naumowicz; K. Wieteska
π
Article
π
1980
π
John Wiley and Sons
π
English
β 148 KB
π 1 views
X-ray Topographic Characterization of L-
β
W.J. Liu; C. Ferrari; M. Zha; L. Zanotti; S.S. Jiang
π
Article
π
2000
π
John Wiley and Sons
π
English
β 236 KB
π 2 views
Optical and X-ray Topographic Studies of
β
Dr. C. C. Desai; Mr. K. V. George
π
Article
π
1981
π
John Wiley and Sons
π
English
β 276 KB
π 1 views
X-ray topographic studies of the melting
β
Dr. G. Mair; Prof. Dr. H. Wenzl
π
Article
π
1976
π
John Wiley and Sons
π
English
β 286 KB
π 1 views
## Abstract The temperature dependence of the concentration and shape of long dislocation lines in pure, nearly perfect gallium crystals has been measured by Xβray topography in anomalous transmission (Borrmannβtopography). The dislocation structure did not change appreciably between temperatures o
X-ray double crystal diffractometer for
β
Dr. sc. nat. L. Dressler; Dr. rer. nat. O. Wehrhan
π
Article
π
1983
π
John Wiley and Sons
π
English
β 223 KB