𝔖 Bobbio Scriptorium
✦   LIBER   ✦

X-ray topographic studies of the melting of nearly perfect gallium crystals

✍ Scribed by Dr. G. Mair; Prof. Dr. H. Wenzl

Publisher
John Wiley and Sons
Year
1976
Tongue
English
Weight
286 KB
Volume
11
Category
Article
ISSN
0232-1300

No coin nor oath required. For personal study only.

✦ Synopsis

Abstract

The temperature dependence of the concentration and shape of long dislocation lines in pure, nearly perfect gallium crystals has been measured by X‐ray topography in anomalous transmission (Borrmann‐topography). The dislocation structure did not change appreciably between temperatures of 22Β°C and at least 0.1 mK below the melting point T~m~ = 29.75Β°C. A few dislocations decreased their length due to tempering at the melting point. Pre‐melting effects could not be detected.

πŸ“œ SIMILAR VOLUMES

The X-ray topographic investigation of d
The X-ray topographic investigation of defect distribution in dendritic silicon crystals along their cross section
✍ Dr. M. Ya. Dashevsky; V. A. Isaakyan; M. A. Khatsernov πŸ“‚ Article πŸ“… 1973 πŸ› John Wiley and Sons 🌐 English βš– 201 KB πŸ‘ 2 views

## Abstract Using the modified method of limited X‐ray topographs the distribution of defects along the silicon dendritic thickness was investigated. It is found that there are two dislocation sources in the given crystals, one of which acts near the surface and generates the loop‐shaped dislocatio