Some experimental results related to a structural study of diamond-like films on silicon substrates are reported. Surface analysis techniques such as electron microscopy, transmission electron microscopy and infrared spectroscopy are used and a conclusion is given.
โฆ LIBER โฆ
X-ray study of silicon distortion on deposition of diamond-like films
โ Scribed by Victor Chaplanov; Igor Galkin; Aleksey Nefedov; Ilja Shipov; Sergey Yakimov; Svetlana Gerasimovich; Vera Elinson; Vladimir Sleptsov
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 289 KB
- Volume
- 228
- Category
- Article
- ISSN
- 0040-6090
No coin nor oath required. For personal study only.
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