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X-ray fluorescent spectrometer with total X-ray reflection for studies of kinetics of thin film deposition

✍ Scribed by V. M. Raznomazov; V. O. Ponomarenko; N. M. Novikovskii; Yu. I. Velichko; A. P. Kovtun; R. V. Vedrinskii; D. A. Sarychev

Book ID
110167196
Publisher
SP MAIK Nauka/Interperiodica
Year
2011
Tongue
English
Weight
283 KB
Volume
47
Category
Article
ISSN
0020-1685

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