Measurements of X-ray fluorescence spectra versus grazing incident angles provide information on elemental composition as well as density and thickness of near surface layers. Calculations of fluorescence intensities are presented, which are used for the evaluation of data obtained by total reflecti
Challenges of total reflection X-ray fluorescence for surface- and thin-layer analysis
✍ Scribed by R. Klockenkämper
- Book ID
- 108261613
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 980 KB
- Volume
- 61
- Category
- Article
- ISSN
- 0584-8547
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