๐”– Bobbio Scriptorium
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Applications of total reflection X-ray fluorescence spectrometry in trace element and surface analysis

โœ Scribed by H. Schwenke; P. A. Beaven; J. Knoth

Publisher
Springer
Year
1999
Tongue
English
Weight
342 KB
Volume
365
Category
Article
ISSN
1618-2650

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๐Ÿ“œ SIMILAR VOLUMES

Total reflection X-ray fluorescence: A t
Total reflection X-ray fluorescence: A technique for trace element analysis in materials
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## Total Reflection X-ray Fluorescence (TXRF) is a variant of Energy dispersive X-ray Fluorescence (EDXRF). It is a comparatively new method of trace element analysis and finds its application in various research areas of material development and processing. The versatility of TXRF is due to (i.) r

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Measurements of X-ray fluorescence spectra versus grazing incident angles provide information on elemental composition as well as density and thickness of near surface layers. Calculations of fluorescence intensities are presented, which are used for the evaluation of data obtained by total reflecti