✦ LIBER ✦

Trace analysis of high-purity copper by total reflection X-ray fluorescence spectrometry

✍ Scribed by Hitoshi Yamaguchi; Sinji Itoh; Shukuro Igarashi; Kunishige Naitoh; Ryosuke Hasegawa

Publisher: Springer
Year: 1998
Tongue: English
Weight: 220 KB
Volume: 362
Category: Article
ISSN: 1618-2650
DOI: 10.1007/s002160051092

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Direct analysis of Al2O3powders by total

Direct analysis of Al2O3powders by total reflection X-ray fluorescence spectrometry

✍ Birgit U. Peschel; Ursula E. A. Fittschen; Giancarlo Pepponi; Christoph Jokuboni 📂 Article 📅 2005 🏛 Springer 🌐 English ⚖ 302 KB

Applications of total reflection X-ray f

Applications of total reflection X-ray fluorescence spectrometry in trace element and surface analysis

✍ H. Schwenke; P. A. Beaven; J. Knoth 📂 Article 📅 1999 🏛 Springer 🌐 English ⚖ 342 KB

Surface analysis by total-reflection X-r

Surface analysis by total-reflection X-ray fluorescence

✍ Héctor J. Sanchez; Carlos A. Perez; Roberto D. Perez; Marcelo Rubio 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 523 KB

Ah&act--This work shows the feasibility of surface analysis though the detection of characteristic fluorescent radiation in the total-reflection regime. A theoretical formalism to correlate surface parameters with X-ray Buorescence intensities from multiple-layer samples was developed. Experimental

Application of total-reflection X-ray fl

Application of total-reflection X-ray fluorescence spectrometry in material analysis

✍ Hoffmann, Peter ;Kein, Martin ;Scheuer, Volker ;Lieser, Karl Heinrich 📂 Article 📅 1990 🏛 Springer-Verlag ⚖ 385 KB

Trace Element Determination in Diesel Pa

Trace Element Determination in Diesel Particulates by Total-Reflection X-Ray Fluorescence Analysis

✍ Vilhunen, Juha K. ;von Bohlen, Alex ;Schmeling, Martina ;Rantanen, Leena ;Mikkon 📂 Article 📅 1999 🏛 Springer-Verlag ⚖ 112 KB

Total reflection X-ray fluorescence spec

Total reflection X-ray fluorescence spectrometry for quantitative surface and layer analysis

✍ U. Weisbrod; R. Gutschke; J. Knoth; H. Schwenke 📂 Article 📅 1991 🏛 Springer 🌐 English ⚖ 622 KB

Measurements of X-ray fluorescence spectra versus grazing incident angles provide information on elemental composition as well as density and thickness of near surface layers. Calculations of fluorescence intensities are presented, which are used for the evaluation of data obtained by total reflecti