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Application of total-reflection X-ray fluorescence spectrometry in material analysis

✍ Scribed by Hoffmann, Peter ;Kein, Martin ;Scheuer, Volker ;Lieser, Karl Heinrich

Publisher: Springer-Verlag
Year: 1990
Weight: 385 KB
Volume: 101
Category: Article
ISSN: 0344-838X
DOI: 10.1007/bf01244183

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