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Development of a total reflection X-ray fluorescence spectrometer for ultra-trace element analysis

โœ Scribed by M. K. Tiwari; B. Gowrishankar; V. K. Raghuvanshi; R. V. Nandedkar; K. J. S. Sawhney

Book ID
110644137
Publisher
Springer-Verlag
Year
2002
Tongue
English
Weight
249 KB
Volume
25
Category
Article
ISSN
0250-4707

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Total reflection X-ray fluorescence: A t
Total reflection X-ray fluorescence: A technique for trace element analysis in materials
โœ N.L. Misra; K.D. Singh Mudher ๐Ÿ“‚ Article ๐Ÿ“… 2002 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 614 KB

## Total Reflection X-ray Fluorescence (TXRF) is a variant of Energy dispersive X-ray Fluorescence (EDXRF). It is a comparatively new method of trace element analysis and finds its application in various research areas of material development and processing. The versatility of TXRF is due to (i.) r