A new spectrometer for total reflection X-ray fluorescence analysis of light elements
โ Scribed by Christina Streli; Peter Wobrauschek; Ernst Unfried; Hannes Aiginger
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 399 KB
- Volume
- 334
- Category
- Article
- ISSN
- 0168-9002
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The application of curved multilayer mirrors as monochromatizing and focusing elements to the primary beam of total reรection x-ray (TXRF) spectrometers is shown to be subjected to constraints which arise mainly as a result of the extended nature of the x-ray source and the low angular spread of the
Total reรection x-ray รuorescence (TXRF) is a well established analytical technique which excels in the determination of trace elements in liquid samples with extremely low detection limits. In TXRF analysis, the use of di โ erent techniques to modify the excitation energy spectrum and to collimate t
Various x-ray optical conรผgurations combining focusing and monochromatizing mirrors for application in total reรฝection x-ray รฝuorescence (TXRF) spectrometry were numerically modelled for the case of extended x-ray sources. The inรฝuence of the system parameters, such as mirror shape, the extension of