This paper reviews and discusses the error factors in quantitative total reflection x-ray fluorescence analysis, primarily with regard to the surface contamination of silicon wafers. The error factors were classified into three origins: instrumental, sample and data processing. The instrumental erro
Direct Analysis of Biological Samples by Total Reflection X-Ray Fluorescence
✍ Scribed by Lue M. Marco P.; Edwin A. Hernandez-Caraballo
- Publisher
- John Wiley and Sons
- Year
- 2005
- Weight
- 8 KB
- Volume
- 36
- Category
- Article
- ISSN
- 0931-7597
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