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Total reflection X-ray fluorescence analysis of light elements using synchrotron radiation

✍ Scribed by Christina Streli; P. Wobrauschek; W. Ladisich; R. Rieder; H. Aiginger; R.W. Ryon; P. Pianetta

Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
362 KB
Volume
345
Category
Article
ISSN
0168-9002

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Total Reflection X-Ray Fluorescence Anal
Total Reflection X-Ray Fluorescence Analysis Excited by Synchrotron Radiation (SR-TXRF): Variation of Excitation Conditions and Sample Geometries
✍ R. GΓΆrgl; P. Wobrauschek; P. Kregsamer; Ch. Streli; M. Haller; A. KnΓΆchel; M. Ra πŸ“‚ Article πŸ“… 1997 πŸ› John Wiley and Sons 🌐 English βš– 341 KB πŸ‘ 2 views

The use of synchrotron radiation as the excitation source for total reΓ‘ection x-ray Γ‘uorescence analysis (SR-TXRF) in combination with a multilayer structure for monochromatization led to detection limits in the femtogram range for medium-Z elements. Experiments were performed at the Hasylab Beamlin