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Total reflection X-ray fluorescence analysis with synchrotron radiation monochromatized by multilayer structures

✍ Scribed by R. Rieder; P. Wobrauschek; W. Ladisich; C. Streli; H. Aiginger; S. Garbe; G. Gaul; A. Knöchel; F. Lechtenberg

Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
699 KB
Volume
355
Category
Article
ISSN
0168-9002

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