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X-ray chemical analysis of YBa2Cu3Ox thin film by total-reflection-angle X-ray spectroscopy

โœ Scribed by Toshio Usui; Masayuki Kamei; Yuji Aoki; Tadataka Morishita; Shoji Tanaka

Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
364 KB
Volume
191
Category
Article
ISSN
0921-4534

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