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Chemical analysis of semiconducting and metallic SmS thin films by X-ray photoelectron spectroscopy

✍ Scribed by Yukimasa Mori; Sakae Tanemura

Publisher: Elsevier Science
Year: 2007
Tongue: English
Weight: 348 KB
Volume: 253
Category: Article
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2006.08.011

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