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Characterisation of thin films of bismuth oxide by X-ray photoelectron spectroscopy

✍ Scribed by Vineet S. Dharmadhikari; S.R. Sainkar; S. Badrinarayan; A. Goswami

Publisher: Elsevier Science
Year: 1982
Tongue: English
Weight: 565 KB
Volume: 25
Category: Article
ISSN: 0368-2048
DOI: 10.1016/0368-2048(82)85016-0

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