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X-ray photoelectron spectroscopy of Zn1−xCdxSe thin films

✍ Scribed by R. Islam; D.R. Rao


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
454 KB
Volume
81
Category
Article
ISSN
0368-2048

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Aluminium nitride thin Ðlms grown at room temperature on degenerate silicon (conducting) substrates have been studied using XPS. The hydrolysis layer at the surface of the AlN was examined using valence band measurements, and the e †ect of 5 kV argon ion milling used to remove the hydrolysis layer w