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X-ray photoelectron spectroscopy characterization of amorphous molybdenum oxysulfide thin films

โœ Scribed by L. Benoist; D. Gonbeau; G. Pfister-Guillouzo; E. Schmidt; G. Meunier; A. Levasseur

Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
508 KB
Volume
258
Category
Article
ISSN
0040-6090

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