Depth-dependent non-destructive analysis of thin overlayers using total-reflection-angle X-ray spectroscopy

✍ Scribed by Noriyoshi Shibata; Soichiro Okubo; Kyoko Yonemitsu

• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 280 KB
• Volume: 100-101
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/0169-4332(96)00259-0