✦ LIBER ✦

Using stuck-at tests to form scan-based tests for transition faults in standard-scan circuits

✍ Scribed by Pomeranz, Irith; Reddy, Sudhakar M.

Book ID: 120617767
Publisher: Association for Computing Machinery
Year: 2009
Tongue: English
Weight: 158 KB
Volume: 15
Category: Article
ISSN: 1084-4309
DOI: 10.1145/1640457.1640464

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Test Strength: A Quality Metric for Tran

Test Strength: A Quality Metric for Transition Fault Tests in Full-Scan Circuits

✍ Pomeranz, I.; Reddy, S.M. 📂 Article 📅 2011 🏛 IEEE 🌐 English ⚖ 212 KB

On Clustering of Undetectable Single Stu

On Clustering of Undetectable Single Stuck-At Faults and Test Quality in Full-Scan Circuits

✍ Pomeranz, I.; Reddy, S.M. 📂 Article 📅 2010 🏛 IEEE 🌐 English ⚖ 288 KB

Input Necessary Assignments for Testing

Input Necessary Assignments for Testing of Path Delay Faults in Standard-Scan Circuits

✍ Pomeranz, I.; Reddy, S.M. 📂 Article 📅 2011 🏛 IEEE 🌐 English ⚖ 245 KB

Local At-Speed Scan Enable Generation fo

Local At-Speed Scan Enable Generation for Transition Fault Testing Using Low-Cost Testers

✍ Ahmed, N.; Tehranipoor, M.; Ravikumar, C.P.; Butler, K.M. 📂 Article 📅 2007 🏛 IEEE 🌐 English ⚖ 546 KB

An algorithm to generate complete test s

An algorithm to generate complete test sets for stuck-at faults in combinational logic circuits

✍ Leonard J. Tung; David V. Kerns 📂 Article 📅 1988 🏛 Elsevier Science 🌐 English ⚖ 581 KB

A new algorithm to generate test sets for stuck-at faults in combinational logic circuits via fault simulation is presented. The algorithm is non-path-sensitizing, non-pathtracing and can be easily implemented on a computer. The stuck-at fault model in the algorithm is developed using the component

[IEEE 2011 16th IEEE European Test Sympo

[IEEE 2011 16th IEEE European Test Symposium (ETS) - Trondheim, Norway (2011.05.23-2011.05.27)] 2011 Sixteenth IEEE European Test Symposium - F-Scan Test Generation Model for Delay Fault Testing at RTL Using Standard Full Scan ATPG

✍ Obien, Marie Engelene J.; Ohtake, Satoshi; Fujiwara, Hideo 📂 Article 📅 2011 🏛 IEEE ⚖ 153 KB