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[IEEE 2011 16th IEEE European Test Symposium (ETS) - Trondheim, Norway (2011.05.23-2011.05.27)] 2011 Sixteenth IEEE European Test Symposium - F-Scan Test Generation Model for Delay Fault Testing at RTL Using Standard Full Scan ATPG

✍ Scribed by Obien, Marie Engelene J.; Ohtake, Satoshi; Fujiwara, Hideo

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