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[IEEE 2011 16th IEEE European Test Symposium (ETS) - Trondheim, Norway (2011.05.23-2011.05.27)] 2011 Sixteenth IEEE European Test Symposium - Critical Fault-Based Pattern Generation for Screening SDDs

✍ Scribed by Bao, Fang; Peng, Ke; Yilmaz, Mahmut; Chakrabarty, Krishnendu; Winemberg, LeRoy; Tehranipoor, Mohammad

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