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[IEEE 2011 16th IEEE European Test Symposium (ETS) - Trondheim, Norway (2011.05.23-2011.05.27)] 2011 Sixteenth IEEE European Test Symposium - Structural Test for Graceful Degradation of NoC Switches

✍ Scribed by Dalirsani, Atefe; Holst, Stefan; Elm, Melanie; Wunderlich, Hans-Joachim

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