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Input Necessary Assignments for Testing of Path Delay Faults in Standard-Scan Circuits

✍ Scribed by Pomeranz, I.; Reddy, S.M.

Book ID: 118271247
Publisher: IEEE
Year: 2011
Tongue: English
Weight: 245 KB
Volume: 19
Category: Article
ISSN: 1063-8210
DOI: 10.1109/tvlsi.2009.2031865

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