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[IEEE 16th Asian Test Symposium (ATS 2007) - Beijing, China (2007.10.8-2007.10.11)] 16th Asian Test Symposium (ATS 2007) - Scan Testing for Complete Coverage of Path Delay Faults with Reduced Test Data Volume, Test Application Time, and Hardware Cost

✍ Scribed by Xiang, Dong; Chakrabarty, Krishnendu; Hu, Dianwei; Fujiwara, Hideo

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