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[IEEE 16th Asian Test Symposium (ATS 2007) - Beijing, China (2007.10.8-2007.10.11)] 16th Asian Test Symposium (ATS 2007) - Response Inversion Scan Cell (RISC): A Peak Capture Power Reduction Technique

✍ Scribed by Chen, Bo-Hua; Kao, Wei-Chung; Bai, Bing-Chuan; Shen, Shyue-Tsong; Li, James C.-M.

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