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[IEEE 16th Asian Test Symposium (ATS 2007) - Beijing, China (2007.10.8-2007.10.11)] 16th Asian Test Symposium (ATS 2007) - Test Generation for Timing-Critical Transition Faults

✍ Scribed by Lin, Xijiang; Kassab, Mark; Rajski, Janusz

No coin nor oath required. For personal study only.

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